These sites provide methods and techniques used in SPM. Scanning probe microscopes image the surface by scanning the object usually with a sharp tip and piezoelectric feedback. Category includes but is not limited to Scanning Tunneling Microscopes (STM), Atomic Force Microscopes (AFM),Scanning Force Microscopes (SFM)and Scanning Near-Field Optical Microscopes (SNOM).
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Sites 4
Ultra-high optical resolution with tip enhanced microscopy with a parabolic mirror. Includes Apace and MagicSERS, a program for view/convert Winspec SPE-spectra.
August 15-18, 2005 conference in Germany for research on force controlled imaging, spectroscopy and manipulation.
Using scanning probe microscopy to explore and manipulate semiconductor surfaces. Department of Chemistry at McMaster University.
Scanning Probe Microscopy: introduction, research work, personnel, recent publications (some .pdf), image gallery, equipment, collaborations and links.
Ultra-high optical resolution with tip enhanced microscopy with a parabolic mirror. Includes Apace and MagicSERS, a program for view/convert Winspec SPE-spectra.
Scanning Probe Microscopy: introduction, research work, personnel, recent publications (some .pdf), image gallery, equipment, collaborations and links.
Using scanning probe microscopy to explore and manipulate semiconductor surfaces. Department of Chemistry at McMaster University.
August 15-18, 2005 conference in Germany for research on force controlled imaging, spectroscopy and manipulation.
